High-resolution scanning SQUID microscope
- J.R. Kirtley
- M.B. Ketchen
- et al.
- 1995
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Quantitative measurement of the stress transfer function in nickel/polyimide thin film/copper thin film structures
- L.S. Schadler
- I.C. Noyan
- 1995
- Applied Physics Letters
PaperRecombination in GaAs at the AlAs oxide-GaAs interface
- J.A. Kash
- B. Pezeshki
- et al.
- 1995
- Applied Physics Letters
PaperFlux dam, a method to reduce extra low frequency noise when a superconducting magnetometer is exposed to a magnetic field
- R.H. Koch
- J.Z. Sun
- et al.
- 1995
- Applied Physics Letters
PaperThin-film temperature rise estimates during low energy ion bombardment in a plasma reactor
- M. Naeem
- D. Chidambarrao
- 1995
- Applied Physics Letters
PaperChemical bonding and atomic structure of Rb+ exchanged KTiOPO4 waveguides probed by micro-Raman spectroscopy
- David D. Tuschel
- Gustavo R. Paz-Pujalt
- et al.
- 1995
- Applied Physics Letters
PaperSurfactants in Si(111) homoepitaxy
- M. Horn-Von Hoegen
- J. Falta
- et al.
- 1995
- Applied Physics Letters
PaperGated Hall effect measurements in high-mobility n-type Si/SiGe modulation-doped heterostructures
- K. Ismail
- M. Arafa
- et al.
- 1995
- Applied Physics Letters
PaperMagnetostatically induced giant magnetoresistance in patterned NiFe/Ag multilayer thin films
- T.L. Hylton
- M. Parker
- et al.
- 1995
- Applied Physics Letters
PaperEvolution of strain relaxation in step-graded SiGe/Si structures
- P.M. Mooney
- J.L. Jordan-Sweet
- et al.
- 1995
- Applied Physics Letters
Paper