Large second-order optical nonlinearities in pulsed laser ablated silicon carbide thin films
- Paul M. Lundquist
- H.C. Ong
- et al.
- 1995
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Electrically detected magnetic resonance study of stress-induced leakage current in thin SiO2
- J.H. Stathis
- 1995
- Applied Physics Letters
PaperCu segregation at the Al(Cu)/Al2O3 interface
- M. Copel
- K.P. Rodbell
- et al.
- 1995
- Applied Physics Letters
PaperHigh-speed single-flux-quantum circuit using planarized niobium-trilayer Josephson junction technology
- P.I. Bunyk
- A. Oliva
- et al.
- 1995
- Applied Physics Letters
PaperIon scattering for in situ characterization of composition of La 2-xSrxCuO4 films
- P.K. Hucknall
- S. Sugden
- et al.
- 1995
- Applied Physics Letters
PaperThermal stability of undoped strained Si channel SiGe heterostructures
- H. Klauk
- T.N. Jackson
- et al.
- 1995
- Applied Physics Letters
PaperReduction of the C54-TiSi2 phase transformation temperature using refractory metal ion implantation
- R. Mann
- G.L. Miles
- et al.
- 1995
- Applied Physics Letters
PaperMagnetic field induced broadening of the resistive transition in epitaxial c-axis-oriented HgBa2CaCu2O6+δ films
- M. Rupp
- A. Gupta
- et al.
- 1995
- Applied Physics Letters
PaperOn the formation of epitaxial CoSi2 from the reaction of Si with a Co/Ti bilayer
- S.-L. Zhang
- J. Cardenas
- et al.
- 1995
- Applied Physics Letters
PaperDopant interactions during the diffusion of arsenic and boron in opposite directions in polycrystalline/monocrystalline silicon structures
- Joachim N. Burghartz
- Carol L. Stanis
- et al.
- 1995
- Applied Physics Letters
Paper