Chemical mapping of patterned polymer photoresists by near-field infrared microscopy
- Bogdan Dragnea
- Jan Preusser
- et al.
- 2001
- Applied Surface Science
Paper
Publications
3552 results for Materials Discovery
High Sensitivity, Low Voltage Silicon Photodetectors Compatible with Silicon Integration
- J.A. Wahl
- Dennis Rogers
- et al.
- 2001
- CLEO 2001
Conference paperCharge-carrier injection into CuPc thin films: A scanning tunneling microscopy study
- S.F. Alvarado
- L. Rossi
- et al.
- 2001
- Synthetic Metals
PaperAging induced traps in organic semiconductors
- J. Steiger
- S. Karg
- et al.
- 2001
- Synthetic Metals
PaperWear of ultrathin carbon overcoat characterized by microwear scan and Auger electron spectroscopy
- Tsai-Wei Wu
- Vaughn Deline
- et al.
- 2001
- Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
PaperTexture evolution in Al(Cu) interconnect materials
- C.E. Murray
- K.P. Rodbell
- 2001
- MRS Proceedings 2001
Conference paperModeling of dislocations in an epitaxial island structure
- X.-H. Liu
- F.M. Ross
- et al.
- 2001
- MRS Proceedings 2001
Conference paperEnergy level alignment and exciton binding energies using model interfaces between metals and evaporable organic electroluminescent materials
- Santos F. Alvarado
- Walter Rieß
- 2001
- MRS Proceedings 2001
Conference paperProspects for the Mott transition field effect transistor
- J. Misewich
- A.G. Schrott
- 2001
- MRS Proceedings 2001
Conference paperIndustrial/academic internships at IBM-almaden under NSF programs
- Charles G. Wade
- Dolores Miller
- et al.
- 2001
- MRS Spring Meeting 2001
Conference paper