Dislocation modeling for the silicon world
- K.W. Schwarz
- X.H. Liu
- et al.
- 2001
- Materials Science and Engineering: A
Paper
Publications
3552 results for Materials Discovery
Interfacial reaction pathways and kinetics during annealing of epitaxial Al/TiN(001) model diffusion barrier systems
- J.-S. Chun
- P. Desjardins
- et al.
- 2001
- Thin Solid Films
PaperDynamics of transient events at the head/disk interface
- Bernhard Knigge
- Frank E. Talke
- 2001
- Tribology International
PaperRelationship between deprotection and film thickness loss during plasma etching of positive tone chemically amplified resists
- A. Mahorowala
- D. Medeiros
- 2001
- Journal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
PaperObservation of Long Decoherence Times in a Quantum Logic Gate using Trapped Ba137 Ions
- Ralph DeVoe
- Christian Kurtsiefer
- 2001
- ICQI 2001
Conference paperFrom extensional to intensional description
- John Knapman
- 2001
- ICQI 2001
Conference paperA route to nanoscopic SiO2 posts via block copolymer templates
- Ho-Cheol Kim
- Xinqiao Jia
- et al.
- 2001
- Advanced Materials
PaperMicrofluidic networks made of poly(dimethylsiloxane), Si, and Au coated with polyethylene glycol for patterning proteins onto surfaces
- Alexander Papra
- André Bernard
- et al.
- 2001
- Langmuir
PaperLocal Au coverage as driving force for Au induced faceting of vicinal Si(0 0 1): A LEEM and XPEEM study
- F.-J. Meyer Zu Heringdorf
- R. Hild
- et al.
- 2001
- Surface Science
PaperElectromigration in AlCu lines: Comparison of Dual Damascene and metal reactive ion etching
- R. Filippi
- M. Gribelyuk
- et al.
- 2001
- Thin Solid Films
Paper