Charge trapping and detrapping in HfO2 high-κ gate stacks
- E. Gusev
- C. D'Emic
- et al.
- 2003
- INFOS 2003
Conference paper
Publications
26858 results for Science
Charge trapping in SiO2/HfO2 gate dielectrics: Comparison between charge-pumping and pulsed ID-VG
- A. Kerber
- E. Cartier
- et al.
- 2003
- INFOS 2003
Conference paperAmbipolar-to-unipolar conversion of carbon nanotube transistors by gate structure engineering
- Yu-Ming Lin
- Joerg Appenzeller
- et al.
- 2004
- Nano Letters
PaperToF-SIMS studies of nanoporous PMSSQ materials: Kinetics and reactions in the processing of low-K dielectrics for ULSI applications
- P. Lazzeri
- G.W. Rubloff
- et al.
- 2004
- Surface and Interface Analysis
PaperA Comparison of Parallel Programming Models of Network Processors
- Carsten Albrecht
- Rainer Hagenau
- et al.
- 2004
- ARCS 2004
Workshop paperParallelism in a CRC Coprocessor
- Andreas Döring
- 2004
- ARCS 2004
Workshop paperPinning action of correlated disorder against equilibrium properties of HgBa2Ca2Cu3Ox
- J.R. Thompson
- J.G. Ossandon
- et al.
- 2004
- Physical Review B - CMMP
PaperImproving large-scale proteomics by clustering of mass spectrometry data
- Ilan Beer
- Eilon Barnea
- et al.
- 2004
- Proteomics
PaperAdaptive versus non-adaptive security of multi-party protocols
- Ran Canetti
- Ivan Damgård
- et al.
- 2004
- Journal of Cryptology
PaperCurrent-induced magnetization switching in small domains of different anisotropies
- Ya. B. Bazaliy
- B. Jones
- et al.
- 2004
- Physical Review B - CMMP
Paper