X-ray diffraction analysis of SiGe/Si heterostructures on sapphire substrates
- P.M. Mooney
- J.A. Ott
- et al.
- 1998
- Applied Physics Letters
Paper
Publications
2351 results at Applied Physics Letters
Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffraction
- P.-C. Wang
- G.S. Cargill
- et al.
- 1998
- Applied Physics Letters
PaperPhotothermal displacement measurement of transient melting and surface deformation during pulsed laser heating
- Shaochen Chen
- Costas P. Grigoropoulos
- et al.
- 1998
- Applied Physics Letters
PaperFabrication of midgap metal gates compatible with ultrathin dielectrics
- D.A. Buchanan
- F.R. McFeely
- et al.
- 1998
- Applied Physics Letters
ReviewLow temperature formation of C54-TiSi2 using titanium alloys
- C. Cabral Jr.
- L. Clevenger
- et al.
- 1997
- Applied Physics Letters
PaperUltimate limit for defect generation in ultra-thin silicon dioxide
- D.J. DiMaria
- J.H. Stathis
- 1997
- Applied Physics Letters
PaperPolarization of an organic monomeric glass
- Tom Karis
- R.J. Twieg
- et al.
- 1997
- Applied Physics Letters
PaperLocalized electron trapping and trap distributions in SiO2 gate oxides
- R. Ludeke
- H.J. Wen
- 1997
- Applied Physics Letters
PaperDoping gas effects on plasma enhanced chemical vapor deposition on heavily phosphorus-doped n+ silicon film
- Yue Kuo
- 1997
- Applied Physics Letters
PaperDemonstrated low radiative loss of a quadrupole ultrashort electrical pulse propagated on a three strip coplanar transmission line
- R.W. McGowan
- D. Grischkowsky
- et al.
- 1997
- Applied Physics Letters
Paper