Publications

124 results for Yu Zhu

Influence of bottom contact material on the selective chemical vapor deposition of crystalline GeSbTe alloys
- - Alejandro G. Schrott
  - Chieh-Fang Chen
  - et al.
- 2010
- MRS Online Proceedings Library
Challenges and solutions of FinFET integration in an SRAM cell and a logic circuit for 22 nm node and beyond
- - H. Kawasaki
  - V.S. Basker
  - et al.
- 2009
- IEDM 2009
Understanding amorphous states of phase-change memory using frenkel-poole model
- - Y.H. Shih
  - M.H. Lee
  - et al.
- 2009
- IEDM 2009
Reduction of random telegraph noise in high-κ / metal-gate stacks for 22 nm generation FETs
- - N. Tega
  - H. Miki
  - et al.
- 2009
- IEDM 2009
Extremely thin SOI (ETSOI) CMOS with record low variability for low power system-on-chip applications
- - K. Cheng
  - A. Khakifirooz
  - et al.
- 2009
- IEDM 2009
Fully depleted extremely thin SOI technology fabricated by a novel integration scheme featuring implant-free, zero-silicon-loss, and faceted raised source/drain
- - K. Cheng
  - A. Khakifirooz
  - et al.
- 2009
- VLSI Technology 2009
Electrical and materials characterization of reactive and co-sputtered tantalum carbide metal electrodes for high-K gate applications
- - L.F. Edge
  - T. Vo
  - et al.
- 2009
- ECS Meeting 2009
22 nm technology compatible fully functional 0.1 μm ² 6T-sram cell
- - B. Haran
  - A. Kumar
  - et al.
- 2008
- IEDM 2008
Mechanisms of retention loss in Ge₂Sb₂Te ₅-based phase-change memory
- - Y.H. Shih
  - J.Y. Wu
  - et al.
- 2008
- IEDM 2008
On the dynamic resistance and reliability of phase change memory
- - B. Rajendran
  - M.H. Lee
  - et al.
- 2008
- VLSI Technology 2008