Publications

31 results for D.R. Young

Radiation damage in silicon dioxide films exposed to reactive ion etching
- - D.J. DiMaria
  - L.M. Ephrath
  - et al.
- 2008
- Journal of Applied Physics
Exciton or hydrogen diffusion in SiO₂?
- - Z.A. Weinberg
  - D.R. Young
  - et al.
- 2008
- Journal of Applied Physics
Measurements of hydrogen in metal-oxide-semiconductor structures using nuclear reaction profiling
- - A.D. Marwick
  - D.R. Young
- 1988
- Journal of Applied Physics
Defect microchemistry at the SiO2/Si interface
- - G.W. Rubloff
  - K. Hofmann
  - et al.
- 1987
- Physical Review Letters
Hole trapping in SiO₂ films annealed in low-pressure oxygen atmosphere
- - K. Hofmann
  - D.R. Young
  - et al.
- 1987
- Journal of Applied Physics
High temperature reaction and defect chemistry at the Si/SiO₂ interface
- - K. Hofmann
  - G.W. Rubloff
  - et al.
- 1987
- Applied Surface Science
Role of oxygen in defect-related breakdown in thin SiO₂ films on Si (100)
- - K. Hofmann
  - G.W. Rubloff
  - et al.
- 1987
- Journal of Applied Physics
Reduction of electron and hole trapping in SiO₂ by rapid thermal annealing
- - Z.A. Weinberg
  - D.R. Young
  - et al.
- 1984
- Applied Physics Letters
Current-induced hydrogen migration and interface trap generation in aluminum-silicon dioxide-silicon capacitors
- - F.J. Feigl
  - R. Gale
  - et al.
- 1984
- Nuclear Inst. and Methods in Physics Research, B
Charge transport and trapping phenomena in off-stoichiometric silicon dioxide films
- - D.J. DiMaria
  - D.W. Dong
  - et al.
- 1983
- Journal of Applied Physics