Dual electron injector structure
- D.J. Dimaria
- D.W. Dong
- 2008
- Applied Physics Letters
Paper
Publications
119 results for D.J. DiMaria
High current injection into SiO2 from Si rich SiO2 films and experimental applications
- D.J. DiMaria
- D.W. Dong
- 2008
- Journal of Applied Physics
PaperHole trapping in the bulk of SiO2 layers at room temperature
- R.F. DeKeersmaecker
- D.J. Dimaria
- 2008
- Journal of Applied Physics
PaperElectron trapping and detrapping characteristics of arsenic-implanted SiO2 layers
- R.F. DeKeersmaecker
- D.J. Dimaria
- 2008
- Journal of Applied Physics
PaperAttenuated total reflectance study of silicon-rich silicon dioxide films
- A. Hartstein
- D.J. Dimaria
- et al.
- 2008
- Journal of Applied Physics
PaperCharge trapping studies in SiO2 using high current injection from Si-rich SiO2 films
- D.J. DiMaria
- R. Ghez
- et al.
- 2008
- Journal of Applied Physics
PaperEffects on interface barrier energies of metal-aluminum oxide-semiconductor (MAS) structures as a function of metal electrode material, charge trapping, and annealing
- D.J. DiMaria
- 2003
- Journal of Applied Physics
PaperAnode hole injection, defect generation, and breakdown in ultrathin silicon dioxide films
- D.J. DiMaria
- J.H. Stathis
- 2001
- Journal of Applied Physics
PaperUltrathin high-K gate stacks for advanced CMOS devices
- E. Gusev
- D.A. Buchanan
- et al.
- 2001
- Technical Digest - International Electron Devices Meeting
PaperDefect generation in ultrathin silicon dioxide films produced by anode hole injection
- D.J. DiMaria
- 2000
- Applied Physics Letters
Paper