Secondary ion emission from binary alloy systems. Part II: Ar1 bombardment with O2 absorption
- Ming L. Yu
- Wilhad Reuter
- 1981
- Journal of Applied Physics
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38 results for W. Reuter
Detection of impurities on silicon surfaces
- D.J. DiMaria
- W. Reuter
- et al.
- 1981
- Journal of Applied Physics
Al diffusivity as a function of growth rate during the formation of (GaAl)As heterojunctions by liquid phase epitaxy
- M.B. Small
- R. Ghez
- et al.
- 1981
- Journal of Applied Physics
Thickness-dependent conductivity and photoconductivity of hydrogenated amorphous silicon
- M.H. Brodsky
- F. Evangelisti
- et al.
- 1980
- Solar Cells
An AES-SIMS study of silicon oxidation induced by ion or electron bombardment
- W. Reuter
- K. Wittmaack
- 1980
- Applications of Surface Science
Detection sensitivities in proton and electron induced X-ray spectroscopy
- Wilhad Reuter
- Allen Lurio
- 1978
- Nuclear Instruments and Methods
Lead in holmium iron garnet films grown from fluxed melts by liquid phase epitaxy
- J.E. Davies
- E.A. Giess
- et al.
- 1976
- Journal of Crystal Growth
Electron probe microanalysis
- Wilhad Reuter
- 1971
- Surface Science