Publications

38 results for W. Reuter

Relative elemental sensitivity factors in secondary neutral mass spectrometry
- - A. Wucher
  - F. Novak
  - et al.
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Angular distribution of particles sputtered from metals and alloys
- - A. Wucher
  - W. Reuter
- 1988
- Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
A SIMS-XPS study on silicon and germanium under O⁺₂ bombardment
- - W. Reuter
- 1986
- Nuclear Inst. and Methods in Physics Research, B
Paper
Techniques for the compositional and chemical state analysis of surfaces and thin films
- - W. Reuter
- 1983
- Nuclear Instruments and Methods In Physics Research
Paper
Low defect density amorphous hydrogenated silicon prepared by homogeneous chemical vapor deposition
- - B.A. Scott
  - J.A. Reimer
  - et al.
- 1982
- Applied Physics Letters
Paper
Anomalous diffusion behavior of Mg in GaAs
- - M.B. Small
  - R.M. Potemski
  - et al.
- 1982
- Applied Physics Letters
Paper
Positive secondary-ion emission from Fe-Ni alloys under O⁺₂ bombardment at 45° incidence
- - W. Reuter
  - M.L. Yu
- 1982
- Journal of Applied Physics
Paper
Probe layer measurements of electroluminescence excitation in ac thin-film devices
- - V. Marrello
  - L. Samuelson
  - et al.
- 1981
- Journal of Applied Physics
Paper
Al diffusivity as a function of growth rate during the formation of (GaAl)As heterojunctions by liquid phase epitaxy
- - M.B. Small
  - R. Ghez
  - et al.
- 1981
- Journal of Applied Physics
Paper
Detection of impurities on silicon surfaces
- - D.J. DiMaria
  - W. Reuter
  - et al.
- 1981
- Journal of Applied Physics
Paper