Characterization of random process variations using ultralow-power, high-sensitivity, bias-free sub-threshold process sensor
- Mesut Meterelliyoz
- Peilin Song
- et al.
- 2010
- IEEE TCAS-I
Paper
Publications
3 results for Mesut Meterelliyoz
Statistical yield analysis of silicon-on-insulator embedded DRAM
- R. Kanj
- R.V. Joshi
- et al.
- 2009
- ISQED 2009
Conference paperRethinking refresh: Increasing availability and reducing power in dram for cache applications
- Philip G. Emma
- William R. Reohr
- et al.
- 2008
- IEEE Micro
Paper