Publications

2 results for Patrick Lysaght

Origin of the flatband-voltage roll-off phenomenon in metal/high-k gate stacks
- - Gennadi Bersuker
  - Chang Seo Park
  - et al.
- 2010
- IEEE T-ED
Surface potential and morphology issues of annealed (HfO ₂) _x(SiO ₂) _1-x gate oxides
- - R. Ludeke
  - P. Lysaght
  - et al.
- 2004
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures