Publications

5 results for Gennadi Bersuker

Origin of the flatband-voltage roll-off phenomenon in metal/high-k gate stacks
- - Gennadi Bersuker
  - Chang Seo Park
  - et al.
- 2010
- IEEE T-ED
Paper
The dielectric breakdown in gate oxides under high field stress
- - S. Lombardo
  - J.H. Stathis
  - et al.
- 2009
- ECS Meeting 2009
Conference paper
A new methodology for characterizing the progressive BD of HfO ₂/SiO₂ metal gate stacks
- - R. Pagano
  - S. Lombardo
  - et al.
- 2008
- SBMicro 2008
Conference paper
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks
- - R. Pagano
  - S. Lombardo
  - et al.
- 2008
- Microelectronics Reliability
Paper
Surface potential and morphology issues of annealed (HfO ₂) _x(SiO ₂) _1-x gate oxides
- - R. Ludeke
  - P. Lysaght
  - et al.
- 2004
- Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Conference paper