Rule-based data mining for yield improvement in semiconductor manufacturing
- Sholom M. Weiss
- Robert J. Baseman
- et al.
- 2009
- Applied Intelligence
Publications
4 results for Raminderpal Singh
RFCMOS technology from 0.25μm to 65nm: The state of the art
- J.J. Pekarik
- D.R. Greenberg
- et al.
- 2004
- CICC 2004
On-chip interconnect-aware design and modeling methodology, based on high bandwidth transmission line devices
- D. Goren
- M. Zelikson
- et al.
- 2003
- DAC 2003
Integrated SiGe and Si device capabilities and trends for multi-gigahertz applications
- G. Freeman
- B. Jagannathan
- et al.
- 2003
- International Journal of High Speed Electronics and Systems