Technology variability from a design perspective
- Borivoje Nikolić
- Ji-Hoon Park
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- 2011
- IEEE TCAS-I
Review
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2 results for Costas Spanos
Measurement and analysis of variability in 45 nm strained-Si CMOS technology
- Liang-Teck Pang
- Kun Qian
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- 2009
- IEEE Journal of Solid-State Circuits
Paper