Publications

2 results for Kun Qian

Technology variability from a design perspective
- - Borivoje Nikolić
  - Ji-Hoon Park
  - et al.
- 2011
- IEEE TCAS-I
Measurement and analysis of variability in 45 nm strained-Si CMOS technology
- - Liang-Teck Pang
  - Kun Qian
  - et al.
- 2009
- IEEE Journal of Solid-State Circuits