Transistor mismatch properties in deep-submicrometer CMOS technologies
- Xiaobin Yuan
- Takashi Shimizu
- et al.
- 2011
- IEEE T-ED
Publications
5 results for C. Michael Olsen
Benchmark tests for MOSFET compact models with application to the PSP model
- Xin Li
- Weimin Wu
- et al.
- 2009
- IEEE Transactions on Electron Devices
Inter-laboratory comparison of CMOS distortion measurements
- Kate A. Remley
- Joe Gering
- et al.
- 2007
- ARFTG 2007
Distortion simulations with the PSP model: Common-gate circuits
- C. Michael Olsen
- Lawrence F. Wagner
- et al.
- 2007
- RFIC 2007
LINFET: A BSIM class FET model with smooth derivatives at Vds=0
- Lawrence F. Wagner
- C. Michael Olsen
- 2007
- NSTI-Nanotech 2007