Publications

3 results for Jiun-Hsin Liao

Combined C-V/I-V front-end-of-line measurement
- - Stas Polonsky
  - Simeon Realov
  - et al.
- 2012
- ICMTS 2012
Front-end-of-line quadrature-clocked voltage-dependent capacitance measurement
- - Stas Polonsky
  - Paul Solomon
  - et al.
- 2011
- ICMTS 2011
New tools and methodology for advanced parametric and defect structure test
- - Raphael Robertazzi
  - Louis Medina
  - et al.
- 2010
- IEEE ITC 2010