Publications

2 results for Julie Lee

High performance bulk planar 20nm CMOS technology for low power mobile applications
- - Huiling Shang
  - Sameer Jain
  - et al.
- 2012
- VLSI Technology 2012
E-beam inspection for detection of sub-design rule physical defects
- - Oliver D. Patterson
  - Julie Lee
  - et al.
- 2012
- ASMC 2012