Operational amplifier based test structure for transistor threshold voltage variation
- Brian L. Ji
- Dale J. Pearson
- et al.
- 2008
- ICMTS 2008
Publications
109 results for David J. Frank
An analytical model for intrinsic carbon nanotube FETs
- Lan Wei
- David J. Frank
- et al.
- 2008
- ESSDERC 2008
High performance CMOS variability in the 65nm regime and beyond
- Sani Nassif
- Kerry Bernstein
- et al.
- 2007
- IEDM 2007
35nm SOI-CMOS for sub-ambient temperature operation
- Cai Jin
- David J. Frank
- et al.
- 2007
- VLSI-TSA 2007
Overlay as the key to drive wafer scale 3D integration
- Steven E. Steen
- Douglas LaTulipe
- et al.
- 2007
- Microelectronic Engineering
Design and CAD challenges in 45nm CMOS and beyond
- David J. Frank
- Ruchir Puri
- et al.
- 2006
- ICCAD 2006
Critical aspects of layer transfer and alignment tolerances for 3D integration processes
- D.C. La Tulipe
- L.T. Shi
- et al.
- 2006
- GBC 2006
Optimizing CMOS technology for maximum performance
- David J. Frank
- Wilfried Haensch
- et al.
- 2006
- IBM J. Res. Dev
High-performance CMOS variability in the 65-nm regime and beyond
- Kerry Bernstein
- David J. Frank
- et al.
- 2006
- IBM J. Res. Dev
Three-dimensional integrated circuits
- Anna W. Topol
- Douglas C. La Tulipe Jr.
- et al.
- 2006
- IBM J. Res. Dev