Publications

2 results for J.J. An

Electromigration in Cu(Al) and Cu(Mn) damascene lines
- - C.-K. Hu
  - J. Ohm
  - et al.
- 2012
- Journal of Applied Physics
Effects of Al and Mn impurities on Cu electromigration
- - C.-K. Hu
  - J. Ohm
  - et al.
- 2011
- ADMETA 2011