Tester-based methods to enhance spatial resolvability and interpretation of time-integrated and time-resolved emission measurementsFranco StellariPeilin Songet al.2013ISTFA 2013Conference paper
A Superconducting Nanowire Single-Photon Detector (SnSPD) system for ultra low voltage Time-Resolved Emission (TRE) measurements of VLSI circuitsFranco StellariAlan J. Wegeret al.2013ISTFA 2013Conference paper
32nm CMOS SOI test site for emission tool evaluationAlan J. WegerFranco Stellariet al.2013ISTFA 2013Conference paper