Publications

3 results for Chadwin D. Young

Fast and slow transient charging in various III-V field-effect transistors with atomic-layer-deposited-Al₂O₃ gate dielectric
- - Michael E. Ramón
  - Tarik Akyol
  - et al.
- 2013
- Applied Physics Letters
Paper
A new methodology for characterizing the progressive BD of HfO ₂/SiO₂ metal gate stacks
- - R. Pagano
  - S. Lombardo
  - et al.
- 2008
- SBMicro 2008
Conference paper
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks
- - R. Pagano
  - S. Lombardo
  - et al.
- 2008
- Microelectronics Reliability
Paper