Publications

75 results for Christopher P. D’Emic

Measurements of inter-and-intra device transient thermal transport on SOI FETs
- - P. Solomon
  - M. Shamsa
  - et al.
- 2007
- IEDM 2007
Silicon-on-insulator MOSFETs with hybrid crystal orientations
- - M. Yang
  - K.K. Chan
  - et al.
- 2006
- VLSI Technology 2006
Bias-temperature instabilities and radiation effects in MOS devices
- - X.J. Zhou
  - D.M. Fleetwood
  - et al.
- 2005
- IEEE TNS
High performance FDSOI CMOS technology with metal gate and high-k
- - Bruce Doris
  - Y.-H. Kim
  - et al.
- 2005
- VLSI Technology 2005
Enabling SOI-based assembly technology for three-dimensional (3D) integrated circuits (ICs)
- - A. Topol
  - D.C. La Tulipe
  - et al.
- 2005
- IEDM 2005
Assembly technology for three dimensional integrated circuits
- - A. Topol
  - D.C. La Tulipe
  - et al.
- 2005
- VMIC 2005
Reverse short channel effects in high-k gated nMOSFETs
- - J.-P. Han
  - S.M. Koo
  - et al.
- 2005
- Microelectronics Reliability
Charge trapping and annealing in high-k gate dielectrics
- - James A. Felix
  - Marty R. Shaneyfelt
  - et al.
- 2004
- IEEE TNS
Interface engineering for enhanced electron mobilities in W/HfO ₂ gate stacks
- - A.C. Callegari
  - P. Jamison
  - et al.
- 2004
- IEDM 2004
Charge trapping in aggressively scaled metal gate/high-κ stacks
- - E. Gusev
  - V. Narayanan
  - et al.
- 2004
- IEDM 2004