Alpha-Particle-Induced Soft Error Rate in VLSI Circuits
- George A. Sai-Halasz
- Matthew R. Wordeman
- et al.
- 1982
- IEEE T-ED
Publications
56 results for M. Wordeman
IIA-1 Generalized Scaling Theory and its Application to a 1/4 Micron Mosfet Design
- G. Baccarani
- M.R. Wordeman
- et al.
- 1982
- IEEE T-ED
A 34&181;m2DRAM cell fabricated with a 1&181;m single-level polycide FET technology
- Hu H. Chao
- Robert H. Dermard
- et al.
- 1981
- ISSCC 1981
A 34 µ m2 DRAM Cell Fabricated with a 1 µm Single-Level Polycide FET Technology
- Hu H. Chao
- Robert H. Dennard
- et al.
- 1981
- IEEE Journal of Solid-State Circuits
Threshold Voltage Characteristics of Depletion-Mode MOSFET's
- Matthew R. Wordeman
- Robert H. Dennard
- 1981
- IEEE T-ED
Monte Carlo Modeling of the Transport of Ionizing Radiation Created Carriers in Integrated Circuits
- G.A. Sai-Halasz
- M.R. Wordeman
- 1980
- IEEE Electron Device Letters