Characterization of the cathode objective lens by Real-Space Microspot Low Energy Electron Diffraction
- Rudolf M. Tromp
- 2013
- Ultramicroscopy
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226 results for Rudolf M. Tromp
A new aberration-corrected, energy-filtered LEEM/PEEM instrument II. Operation and results
- Rudolf M. Tromp
- James B. Hannon
- et al.
- 2013
- Ultramicroscopy
Optimization and stability of the contrast transfer function in aberration-corrected electron microscopy
- Rudolf M. Tromp
- S.M. Schramm
- 2013
- Ultramicroscopy
Selected-area diffraction and spectroscopy in LEEM and PEEM
- R.M. Tromp
- 2012
- Ultramicroscopy
Aberrations of the cathode objective lens up to fifth order
- R.M. Tromp
- W. Wan
- et al.
- 2012
- Ultramicroscopy
A Contrast Transfer Function approach for image calculations in standard and aberration-corrected LEEM and PEEM
- S.M. Schramm
- A.B. Pang
- et al.
- 2012
- Ultramicroscopy
Highly uniform step and terrace structures on SiC(0001) surfaces
- J. Sun
- J.B. Hannon
- et al.
- 2011
- IBM J. Res. Dev
Low-energy electron microscopy and spectroscopy with ESCHER: Status and prospects
- S.M. Schramm
- J. Kautz
- et al.
- 2011
- IBM J. Res. Dev
A simple in situ method to detect graphene formation at SiC surfaces
- Satoshi Oida
- James B. Hannon
- et al.
- 2011
- Applied Physics Letters
Low energy electron microscopy imaging using Medipix2 detector
- I. Sikharulidze
- R. Van Gastel
- et al.
- 2011
- Nucl. Instrum. Methods Phys. Res