Extracting transverse electron mean free paths in graphene at low energy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2023
- Ultramicroscopy
Publications
7 results for Daniël Geelen
Complementary LEEM and eV-TEM for imaging and spectroscopy
- Peter S. Neu
- Daniël Geelen
- et al.
- 2021
- Ultramicroscopy
Nonuniversal Transverse Electron Mean Free Path through Few-layer Graphene
- Daniël Geelen
- J. Jobst
- et al.
- 2019
- Physical Review Letters
Charge Catastrophe and Dielectric Breakdown during Exposure of Organic Thin Films to Low-Energy Electron Radiation
- A. Thete
- Daniël Geelen
- et al.
- 2017
- Physical Review Letters
eV-TEM: Transmission electron microscopy in a low energy cathode lens instrument
- Daniël Geelen
- A. Thete
- et al.
- 2015
- Ultramicroscopy
Nanoscale measurements of unoccupied band dispersion in few-layer graphene
- J. Jobst
- Jaap Kautz
- et al.
- 2015
- Nature Communications
Low-energy electron (0-100eV) interaction with resists using LEEM
- A. Thete
- Daniël Geelen
- et al.
- 2015
- SPIE Advanced Lithography 2015