Criticality of low-energy protons in single-event effects testing of highly-scaled technologies
- Jonathan A. Pellish
- Paul W. Marshall
- et al.
- 2014
- IEEE TNS
Publications
2 results for Carlos M. Castaneda
Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- David F. Heidel
- Paul W. Marshall
- et al.
- 2009
- IEEE TNS