Publications

12 results for Daniel M. Fleetwood

Low-frequency noise and radiation response of metal-oxide-semiconductor transistors with Al ₂O ₃/SiO _xN _y/Si(100) gate stacks
- - H.D. Xiong
  - D.M. Fleetwood
  - et al.
- 2003
- Applied Physics Letters
Paper
Radiation-Induced Charge Trapping in Thin Al₂O ₃/SiO_xN_y/Si(100) Gate Dielectric Stacks
- - J.A. Felix
  - M.R. Shaneyfelt
  - et al.
- 2003
- IEEE TNS
Conference paper