Single-event upsets and multiple-bit upsets on a 45 nm SOI SRAM
- David F. Heidel
- Paul W. Marshall
- et al.
- 2009
- IEEE TNS
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14 results for M.R. Shaneyfelt
Low energy proton single-event-upset test results on 65 nm SOI SRAM
- David F. Heidel
- Paul W. Marshall
- et al.
- 2008
- IEEE TNS
Charge trapping and annealing in high-k gate dielectrics
- James A. Felix
- Marty R. Shaneyfelt
- et al.
- 2004
- IEEE TNS
Effects of radiation and charge trapping on the reliability of high- κ gate dielectrics
- J.A. Felix
- J.R. Schwank
- et al.
- 2004
- Microelectronics Reliability