Analysis and modeling of dc current crowding for tsv-based 3-d connections and power integrity
- Xin Zhao
- Michael R. Scheuermann
- et al.
- 2014
- IEEE Transactions on CPMT
Paper
Publications
3 results for Xin Zhao
Transient modeling of TSV-wire electromigration and lifetime analysis of power distribution network for 3D ICs
- Xin Zhao
- Yang Wan
- et al.
- 2013
- ICCAD 2013
Conference paperAnalysis of DC current crowding in through-silicon-vias and its impact on power integrity in 3D ICs
- Xin Zhao
- Michael Scheuermann
- et al.
- 2012
- DAC 2012
Conference paper