Publications

2 results for Hailing Wang

Experimental study of gate-first finfet threshold-voltage mismatch
- - Qintao Zhang
  - Cindy Wang
  - et al.
- 2014
- IEEE T-ED
Modeling of width-quantization-induced variations in logic FinFETs for 22nm and beyond
- - Chung-Hsun Lin
  - Wilfried Haensch
  - et al.
- 2011
- VLSI Technology 2011