Wafer scale tilt-compensated silicon nanowire atomic force microscopy probes for high aspect ratio geometries
- Brian A. Bryce
- B. Robert Ilic
- et al.
- 2014
- JMM
Paper
Publications
2 results for B. Robert Ilic
Precise tuning of the switching field in 'implantation patterned' Co/Pt multilayers
- V. Metlushko
- G.W. Crabtree
- et al.
- 2001
- ISDRS 2001
Conference paper