Publications

2 results for Jack Jau

E-beam inspection of EUV mask defects: To etch or not to etch?
- - Ravi Bonam
  - Hung-Yu Tien
  - et al.
- 2014
- SPIE Advanced Lithography 2014
E-beam inspection of EUV programmed defect wafers for printability analysis
- - Ravi Bonam
  - Scott Halle
  - et al.
- 2013
- ASMC 2013