Impact ionization, degradation, and breakdown in SiO2
- D.J. Dimaria
- E. Cartier
- et al.
- 1992
- MRS Proceedings 1992
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182 results for Eduard Cartier
Non-avalanche dielectric breakdown in wide-band-gap insulators at DC and optical frequencies
- P. Braunlich
- S.C. Jones
- et al.
- 1989
- SPIE Laser-Induced Damage in Optical Materials 1989
Monte Carlo calculations of laser-induced free electron heating in SiO2
- D. Arnold
- E. Cartier
- et al.
- 1990
- SPIE Laser-Induced Damage in Optical Materials 1990
Monte Carlo calculations of laser-induced free electron heating in SiO2
- D. Arnold
- E. Cartier
- et al.
- 1990
- SPIE Laser-Induced Damage in Optical Materials 1990
Crystallization of hafnium-oxide-based ferroelectrics for BEOL integration
- Martin M. Frank
- Eduard A. Cartier
- et al.
- 2022
- EDTM 2022
Identification of structural phases in ferroelectric hafnium zirconium oxide by density-functional-theory-assisted EXAFS analysis
- Mehmet Alper Sahiner
- Rory J. Vander Valk
- et al.
- 2021
- Applied Physics Letters
A maximum extreme-value distribution model for switching conductance of oxide-RRAM in memory applications
- Ernest Wu
- Takashi Ando
- et al.
- 2020
- Applied Physics Letters
Evolution of interfacial Fermi level in In0.53Ga0.47As/high-κ/TiN gate stacks
- Adra Carr
- John Rozen
- et al.
- 2015
- Applied Physics Letters
Aggressive SiGe channel gate stack scaling by remote Oxygen scavenging: Gate-first pFET performance and reliability
- Martin M. Frank
- Eduard A. Cartier
- et al.
- 2012
- ECS Solid State Letters
High temperature (1000°C) compatible Y-La-Si-O silicate gate dielectric in direct contact with Si with 7.7 Å equivalent oxide thickness
- Catherine Dubourdieu
- E. Cartier
- et al.
- 2011
- Applied Physics Letters