Publications

4 results for B. Messenger

0.026μm² high performance Embedded DRAM in 22nm technology for server and SOC applications
- - C. Pei
  - G. Wang
  - et al.
- 2014
- IEDM 2014
Conference paper
Early detection of electrical defects in deep trench capacitors using voltage contrast inspection
- - Brian Donovan
  - Oliver D. Patterson
  - et al.
- 2013
- ASMC 2013
Conference paper
Methodology for trench capacitor etch optimization using voltage contrast inspection and special processing
- - Oliver D. Patterson
  - Xing J. Zhou
  - et al.
- 2010
- ASMC 2010
Conference paper
Reliability investigation of NiPtSi electrical fuse with different programming mechanisms
- - C. Tian
  - D. Moy
  - et al.
- 2007
- IIRW 2007
Conference paper