Time-integrated photon emission as a function of temperature in 32 nm CMOS
- Andrea Bahgat Shehata
- Alan J. Weger
- et al.
- 2015
- IRPS 2015
Conference paper
Publications
6 results for Ted Lundquist
Novel NIR camera with extended sensitivity and low noise for photon emission microscopy of VLSI circuits
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2014
- ISTFA 2014
Conference paperUltra-low voltage time-resolved emission measurements from 32 nm SOI CMOS integrated circuits
- Andrea Bahgat Shehata
- Franco Stellari
- et al.
- 2014
- ISTFA 2014
Conference paperA Superconducting Nanowire Single-Photon Detector (SnSPD) system for ultra low voltage Time-Resolved Emission (TRE) measurements of VLSI circuits
- Franco Stellari
- Alan J. Weger
- et al.
- 2013
- ISTFA 2013
Conference paperNear-infrared photon emission spectroscopy trends in scaled SOI technologies
- Ulrike Kindereit
- Alan J. Weger
- et al.
- 2012
- ISTFA 2012
Conference paperNear-infrared photon emission spectroscopy of a 45 nm SOI ring oscillator
- Ulrike Kindereit
- Alan J. Weger
- et al.
- 2012
- IRPS 2012
Conference paper