Medium energy ion scattering of Gr on SiC(0001) and Si(100)
- Matthew Copel
- Satoshi Oida
- et al.
- 2011
- Applied Physics Letters
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150 results for Matthew Copel
Stability of terbium scandate on Si(100)
- Matt Copel
- Nestor Bojarczuk
- et al.
- 2010
- Applied Physics Letters
Decoupling graphene from SiC(0001) via oxidation
- Satoshi Oida
- Fenton R. McFeely
- et al.
- 2010
- Physical Review B - CMMP
Determination of band offsets, chemical bonding, and microstructure of the (TbxSc1-x) 2 O3 /Si system
- I. Geppert
- M. Eizenberg
- et al.
- 2010
- Journal of Applied Physics
Physical origins of mobility degradation in extremely scaled SiO 2 / HfO2 gate stacks with la and Al induced dipoles
- Takashi Ando
- Matt Copel
- et al.
- 2010
- Applied Physics Letters
Temperature-dependent La- and Al-induced dipole behavior monitored by femtosecond pump/probe photoelectron spectroscopy
- Hiroaki Arimura
- Richard Haight
- et al.
- 2010
- Applied Physics Letters
Oxygen migration in TiO2-based higher-k gate stacks
- Sangbum Kim
- Stephen L. Brown
- et al.
- 2010
- Journal of Applied Physics
Interaction of La2O3 capping layers with HfO 2 gate dielectrics
- M. Copel
- S. Guha
- et al.
- 2009
- Applied Physics Letters
Oxygen passivation of vacancy defects in metal-nitride gated HfO 2/SiO2/Si devices
- E. Cartier
- M. Hopstaken
- et al.
- 2009
- Applied Physics Letters
Scaling the MOSFET gate dielectric: From high-k to higher-k? (Invited Paper)
- Martin M. Frank
- SangBum Kim
- et al.
- 2009
- Microelectronic Engineering