Charge defects, Vt shifts, and the solution to the high-k metal gate n-MOSFET problem
- Supratik Guha
- Vijay Narayanan
- et al.
- 2006
- Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS 2006
Conference paper
Publications
150 results for Matthew Copel
Hafnium oxide gate dielectrics on sulfur-passivated germanium
- Martin M. Frank
- Steven J. Koester
- et al.
- 2006
- Applied Physics Letters
PaperHigh-mobility p-type transistor based on a spin-coated metal telluride semiconductor
- David B. Mitzi
- Matthew Copel
- et al.
- 2006
- Advanced Materials
PaperSelf-assembled multilayers of transition-metal-terpyridinyl complexes; formation, and characterization
- Laura Kosbar
- Charan Srinivasan
- et al.
- 2006
- Langmuir
PaperEvidence of electron and hole inversion in GaAs metal-oxide-semiconductor capacitors with HfO 2 gate dielectrics and α-Si/SiO 2 interlayers
- S.J. Koester
- E.W. Kiewra
- et al.
- 2006
- Applied Physics Letters
PaperOxygen transport and reaction mechanisms in rhenium gate contacts on hafnium oxide films on Si
- R.P. Pezzi
- M. Copel
- et al.
- 2006
- Applied Physics Letters
PaperA comparison of electrical and physical properties of MOCVD hafnium silicate thin films deposited using various silicon precursors
- P. Jamison
- M. Copel
- et al.
- 2006
- MRS Spring Meeting 2006
Conference paperEffect of oxide overlayer formation on the growth of gold catalyzed epitaxial silicon nanowires
- Hemanth Jagannathan
- Yoshio Nishi
- et al.
- 2006
- Applied Physics Letters
PaperReduction of hafnium oxide and hafnium silicate by rhenium and platinum
- M. Copel
- R.P. Pezzi
- et al.
- 2006
- Applied Physics Letters
PaperSolution-processed metal chalcogenide films for p-type transistors
- Delia J. Milliron
- David B. Mitzi
- et al.
- 2006
- Chemistry of Materials
Paper