Publications

2 results for Changyong Ahn

Non-resistance metric based read scheme for multi-level PCRAM in 25 nm technology
- - Junho Cheon
  - Insoo Lee
  - et al.
- 2015
- CICC 2015
A 6-bit drift-resilient readout scheme for multi-level phase-change memory
- - A. Athmanathan
  - Milos Stanisavljevic
  - et al.
- 2014
- A-SSCC 2014