Publications

9 results for Chunyan Tian

Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges
- - F. Chen
  - Carole Graas
  - et al.
- 2015
- Microelectronics Reliability
Process dependence of AC/DC PBTI in HKMG n-MOSFETs
- - Wen Liu
  - Giuseppe La Rosa
  - et al.
- 2014
- IRPS 2014
Intrinsic dielectric stack reliability of a high performance bulk planar 20nm replacement gate high-k metal gate technology and comparison to 28nm gate first high-k metal gate process
- - W. McMahon
  - C. Tian
  - et al.
- 2013
- IRPS 2013
High performance bulk planar 20nm CMOS technology for low power mobile applications
- - Huiling Shang
  - Sameer Jain
  - et al.
- 2012
- VLSI Technology 2012
High performance transistors featured in an aggressively scaled 45nm bulk CMOS technology
- - Z. Luo
  - N. Rovedo
  - et al.
- 2007
- VLSI Technology 2007
Reliability investigation of NiPtSi electrical fuse with different programming mechanisms
- - C. Tian
  - D. Moy
  - et al.
- 2007
- IIRW 2007
Reliability qualification of CoSI₂ electrical fuse for 90NM technology
- - C. Tian
  - B. Park
  - et al.
- 2006
- IRPS 2006
A 45 nm CMOS node Cu/low-k/ ULtra low-k PECVD SiCOH (k=2.4) BEOL technology
- - S. Sankaran
  - S. Arai
  - et al.
- 2006
- IEDM 2006
High performance 45-nm SOI technology with enhanced strain, porous low-k BEOL, and immersion lithography
- - S. Narasimha
  - K. Onishi
  - et al.
- 2006
- IEDM 2006