Publications

3 results for Carole Graas

Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges
- - F. Chen
  - Carole Graas
  - et al.
- 2015
- Microelectronics Reliability
Impact of 3D copper TSV integration on 32SOI FEOL and BEOL reliability
- - Mukta Farooq
  - Giuseppe La Rosa
  - et al.
- 2015
- IRPS 2015
A method for rapid screening of various low-k TDDB models
- - F. Chen
  - Carole Graas
  - et al.
- 2015
- IRPS 2015