Field Emitter Failure Mechanisms and Harsh Environment Robustness Studies
- Rushmita Bhattacharjee
- Cody Oberbeck
- et al.
- 2024
- IVEC + IVESC 2024
Conference paper
Publications
7 results for Winston Chern
Auger generation as an intrinsic limit to tunneling field-effect transistor performance
- James T. Teherani
- Sapan Agarwal
- et al.
- 2016
- Journal of Applied Physics
PaperPlasma post-oxidation for high mobility strained-Ge pFETs with aggressively scaled high-κ dielectrics
- Winston Chern
- Pouya Hashemi
- et al.
- 2014
- ECSSMEQ 2014
Conference paperRecord hole mobility at high vertical fields in planar strained germanium on insulator with asymmetric strain
- Winston Chern
- Pouya Hashemi
- et al.
- 2014
- IEEE Electron Device Letters
PaperAggressively scaled strained silicon directly on insulator (SSDOI) FinFETs
- A. Khakifirooz
- R. Sreenivasan
- et al.
- 2013
- S3S 2013
Conference paperHigh mobility high-κ-all-around asymmetrically-strained Germanium nanowire trigate p-MOSFETs
- Winston Chern
- Pouya Hashemi
- et al.
- 2012
- IEDM 2012
Conference paperUltrathin strained-ge channel P-MOSFETs with high-k/metal gate and Sub-1-nm equivalent oxide thickness
- Pouya Hashemi
- Winston Chern
- et al.
- 2012
- IEEE Electron Device Letters
Paper