Publications

2 results for Doowon Leey

Probabilistic bug-masking analysis for post-silicon tests in microprocessor verification
- - Doowon Leey
  - Tom Kolan
  - et al.
- 2016
- DAC 2016
Conference paper
Hybrid checking for microarchitectural validation of microprocessor designs on acceleration platforms
- - Debapriya Chatterjee
  - Biruk Mammo
  - et al.
- 2013
- ICCAD 2013
Conference paper