Publications

3 results for Wen Liu

Layout dependence of gate dielectric TDDB in HKMG FinFET technology
- - Wen Liu
  - Ernest Y. Wu
  - et al.
- 2016
- IRPS 2016
Conference paper
High performance 14nm SOI FinFET CMOS technology with 0.0174μm² embedded DRAM and 15 levels of Cu metallization
- - C.-H.C-H. Lin
  - Brian Greene
  - et al.
- 2014
- IEDM 2014
Conference paper
Process dependence of AC/DC PBTI in HKMG n-MOSFETs
- - Wen Liu
  - Giuseppe La Rosa
  - et al.
- 2014
- IRPS 2014
Conference paper