Charge Trap Transistor (CTT): An embedded fully logic-compatible multiple-time programmable non-volatile memory element for high-k-metal-gate CMOS technologies
- Faraz Khan
- Eduard Cartier
- et al.
- 2017
- IEEE Electron Device Letters
Publications
4 results for Jason C.S. Woo
The Impact of Self-Heating on Charge Trapping in High-k-Metal-Gate nFETs
- Faraz Khan
- Eduard Cartier
- et al.
- 2016
- IEEE Electron Device Letters
High-Gain Lateral Bipolar Action in a Mosfet Structure
- Sophie Verdonckt-Vandebroek
- S. Simon Wong
- et al.
- 1991
- IEEE T-ED
Nonideal Base Current in Bipolar Transistors at Low Temperatures
- Jason C. S. Woo
- James D. Plummer
- et al.
- 1987
- IEEE T-ED