Activation of implanted n-type dopants in Ge over the active concentration of 1× 1020 cm-3 using coimplantation of Sb and PJeehwan KimStephen W. Bedellet al.2009Electrochemical and Solid-State Letters
Hafnium oxide gate dielectrics on sulfur-passivated germaniumMartin M. FrankSteven J. Koesteret al.2006Applied Physics Letters