Publications

103 results for Stephen W. Bedell

Stress determination through diffraction: Establishing the link between Kröner and Voigt/Reuss limits
- - Conal E. Murray
  - Jean L. Jordan-Sweet
  - et al.
- 2015
- Powder Diffraction
Vertical thinking in blue light emitting diodes: GaN-on-graphene technology
- - Can Bayram
  - Jeehwan Kim
  - et al.
- 2015
- SPIE OPTO 2015
Principle of direct van der Waals epitaxy of single-crystalline films on epitaxial graphene
- - Jeehwan Kim
  - Can Bayram
  - et al.
- 2014
- Nature Communications
Gate stacks for silicon, silicon germanium, and III-V channel MOSFETs
- - Martin M. Frank
  - Yu Zhu
  - et al.
- 2014
- ECS Meeting 2014
Advanced flexible electronics: Challenges and opportunities
- - Stephen W. Bedell
  - Davood Shahrjerdi
  - et al.
- 2014
- SPIE Defense + Security 2014
Strain scaling for CMOS
- - Stephen W. Bedell
  - Ali Khakifirooz
  - et al.
- 2014
- MRS Bulletin
Vertical light-emitting diode fabrication by controlled spalling
- - Stephen W. Bedell
  - Can Bayram
  - et al.
- 2013
- Applied Physics Express
Observation of semiconductor device channel strain using in-line high resolution X-ray diffraction
- - Judson R. Holt
  - Anita Madan
  - et al.
- 2013
- Journal of Applied Physics
High-performance Si_1-xGe_x channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- - P. Hashemi
  - M. Kobayashi
  - et al.
- 2013
- VLSI Circuits 2013
High-performance Si_1-xGe_x channel on insulator trigate PFETs featuring an implant-free process and aggressively-scaled fin and gate dimensions
- - P. Hashemi
  - M. Kobayashi
  - et al.
- 2013
- VLSI Technology 2013