Strain distributions and their influence on electronic structures of WSe2-MoS2 laterally strained heterojunctions
- Chendong Zhang
- Ming-Yang Li
- et al.
- 2018
- Nature Nanotechnology
Paper
Publications
10 results for David A. Muller
Three-dimensional measurement of line edge roughness in copper wires using electron tomography
- Peter Ercius
- Lynne M. Gignac
- et al.
- 2009
- Microscopy and Microanalysis
PaperThree-dimensional imaging of nano-voids in copper interconnects using incoherent bright field (IBF) tomography
- Peter Ercius
- David A. Muller
- et al.
- 2006
- AMC 2006
Conference paperThree-dimensional imaging of nano-voids in copper interconnects using incoherent bright field (IBF) tomography
- P.A. Ercius
- D.A. Muller
- et al.
- 2006
- M&M 2006
Conference paperThree-dimensional imaging of nanovoids in copper interconnects using incoherent bright field tomography
- Peter Ercius
- Matthew Weyland
- et al.
- 2006
- Applied Physics Letters
PaperHf O 2 and Al 2 O 3 gate dielectrics on GaAs grown by atomic layer deposition
- Martin M. Frank
- Glen D. Wilk
- et al.
- 2005
- Applied Physics Letters
PaperMeasurement and models of electron-energy-loss spectroscopy core-level shifts in nickel aluminum intermetallics
- David A. Muller
- Philip E. Batson
- 1998
- Physical Review B - CMMP
PaperStructure, chemistry and bonding at grain boundaries in Ni3Al - I. The role of boron in ductilizing grain boundaries
- D.A. Muller
- S. Subramanian
- et al.
- 1996
- Acta Materialia
PaperNear atomic scale studies of electronic structure at grain boundaries in Ni3Al
- David A. Muller
- Shanthi Subramanian
- et al.
- 1995
- Physical Review Letters
PaperThe structure, bonding and chemistry of grain boundaries in Ni3Al
- S. Subramanian
- D.A. Muller
- et al.
- 1995
- Materials Science and Engineering A
Paper